Microprobe Characterization of Optoelectronic Materials (Optoelectronic Properties of Semiconductors and Superlattices, Vol. 17) 1st Edition
Product details
| Management number | 218112901 | Release Date | 2026/05/03 | List Price | US$260.42 | Model Number | 218112901 | ||
|---|---|---|---|---|---|---|---|---|---|
| Category | |||||||||
Each chapter in this book is written by a group of leading experts in one particular type of microprobe technique. They emphasize the ability of that technique to provide information about small structures (i.e. quantum dots, quantum lines), microscopic defects, strain, layer composition, and its usefulness as diagnostic technique for device degradation. Different types of probes are considered (electrons, photons and tips) and different microscopies (optical, electron microscopy and tunneling). It is an ideal reference for post-graduate and experienced researchers, as well as for crystal growers and optoelectronic device makers. Read more
| ISBN10 | 1560329416 |
|---|---|
| ISBN13 | 978-1560329411 |
| Edition | 1st |
| Language | English |
| Publisher | CRC Press |
| Dimensions | 6.25 x 1.5 x 9 inches |
| Item Weight | 2.45 pounds |
| Print length | 730 pages |
| Publication date | November 15, 2002 |
Bestseller ranking
Materials Science
Customers who viewed this product also viewed
V-Belts
Correction of product information
If you notice any omissions or errors in the product information on this page, please use the correction request form below.
Correction Request Form